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This Practice covers the case in which the metrology equipment is used to make binary decisions about the item being measured
This Document provides a test method for the mono-dispersed polystyrene latex (PSL) challenging of liquid filters
This test is optional and may be omitted based on the objective of the testing
but it may be established through use of the wafer coordinate system defined in SEMI M20
SEMI C30-0301 (technical revision)
G08900 - SEMI G89 - Specification for Leadframe Strip Size Revision:SEMI G89-0211 (Reapproved 0823) - Current This Practice covers the caseThe purpose of this Standard is to standardize the strip size specification of leadframe. This defines the width and length of a leadframe strip. This Specification is applicable to various types of quad flat package (QFP) leadframe strips, and small outline package (SOP) leadframe strips. This Standard can be used as a specification when purchasing these leadframe. The configuration of unit designs should be made per the IC chip information. This
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